4 Examples of Nanopositioning in Atomic Force Microscopy (AFM)

Nov 6, 2012 / in Atomic Force Microscopy (AFM) Case Studies / by nPoint

TappingMode™ image of pentacene dendrites on a silicon dioxide substrate acquired with a MultiMode® AFM. Scan size = 11 µm. Image courtesy of Frisbie Group, University of Minnesota.

30µm scan of a lithography pattern created by charge deposition on Si sample. An Agilent 5100 AFM retrofitted with a 100×100µm nPoint scanner was used. Image courtesy of ScienTec, France.

 

Dispersion of single walled carbon nanotubes in N-methyl-pyrolidone (NMP) onto a silicon substrate. The image is a 3.3 µm scan acquired with a Dimension™ 3100 AFM. Image courtesy of Peter Nirmalraj, Jogh Boland group, Trinity College, Dublin.