Montana State University

Nov 16, 2012 / in Atomic Force Microscopy (AFM) Case Studies / by nPoint

TappingMode™ image of indentation patterns on Parafilm® acquired with a MultiMode® AFM. Patterns were produced using LiftMode®. Scan size = 10 μm; large indentation pitch = 2.0 μm; small pitch (arrow) = 200 nm.