Atomic Force Microscopy (AFM) / Material Science
nPoint piezo stages have been traditionally used as closed-loop scanners for Atomic Force Microscopy (AFM). Closed-loop flexure stages offer extremely low out-of-plane motion, no piezo drift, exceptional scanning linearity, longer travel ranges, and measurement precision. Nanopositioning stages are used in nanoindentation when precision positioning and scanning are paramount. Many national labs and academic institutions use nPoint piezo stages for precision positioning of samples for materials research studies.
Showing 1–16 of 18 results
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NPXY50-286 Nanopositioning Piezo Stage
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NPXY60-258 Nanopositioning Piezo Stage
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NPXY100-100 Nanopositioning Piezo Stage
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NPXY100-126 Nanopositioning Piezo Stage
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NPXY200-101 Nanopositioning Piezo Stage
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NPXY250-405 Nanopositioning Piezo Stage
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NPXY50Z20-477 Nanopositioning Piezo Stage
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NPXY60Z20-257 Nanopositioning Piezo Stage
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NPXY100Z25-102 Nanopositioning Piezo Stage
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NPXY200Z25-103 Nanopositioning Piezo Stage
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NPXY100Z10-128 Nanopositioning Piezo Stage
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NPXY100Z25-264 Nanopositioning Piezo Stage
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NPXY100Z50-244 Nanopositioning Piezo Stage
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NPXY100Z100-135 Nanopositioning Piezo Stage
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NPXY200Z10-269 Nanopositioning Piezo Stage
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NPXY200Z25-260 Nanopositioning Piezo Stage