4 Examples of Nanopositioning in Atomic Force Microscopy (AFM)

TappingMode™ image of pentacene dendrites on a silicon dioxide substrate acquired with a MultiMode® AFM. Scan size = 11 µm. Image courtesy of Frisbie Group, University of Minnesota. 30µm scan of a lithography pattern created by charge deposition on Si sample. An Agilent 5100 AFM retrofitted with a 100×100µm nPoint scanner was used. Image courtesy […]

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