The nPoint LC.400 series of controllers have several internal functions for use with raster scanning. A traditional raster scan can be generated via the simple Raster Scanning GUI used in the traditional raster scan below. Additional raster scanning patterns can be generated via the arbitrary scan capability of the controller. This provides complete flexibility for […]
nPoint is now offering an easy way for correcting the orthogonality error of XY scanners for the most demanding scanning applications. This capability is primarily used by OEM customers in applications such as Atomic Force Microscopy (AFM). An external method for measuring the orthogonality error is necessary prior to applying such correction. The AFM application […]
Understanding phase lag is important when scanning at high speeds with piezo flexure stages. This article describes the phase relationship between the command signal and the stage response. The response is monitored using the internal (in this case capacitive) sensor. The bandwidth of a system is the key element to phase lag. Using control parameters […]
A tip tilt piezo stage provides the opportunity to dynamically scan a mirror with extreme precision and control. Piezo mirrors are used for laser beam steering and image stabilization applications. There are a variety of options built into nPoint systems for mounting purposes. Below are only a few suggestions, as custom mounting platforms and stages […]
Nanopositioning systems provide the opportunity to enable many advanced applications. Their use has spread from AFMs to optics and multiple new technologies. While selecting a system can be complex at times, there are three main components that work together to provide motion on the nanoscale. Each component will briefly be discussed and can be studied […]
