Orthogonality Correction for Piezo Flexure Stages

nPoint is now offering an easy way for correcting the orthogonality error of XY scanners for the most demanding scanning applications. This capability is primarily used by OEM customers in applications such as Atomic Force Microscopy (AFM). An external method for measuring the orthogonality error is necessary prior to applying such correction. The AFM application […]

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The New NPXY250-405 Piezo Stage

  The NPXY250-405 piezo stage is the latest addition to nPoint’s nanopositioning lineup.  This stage is designed as an economical XY piezo flexure stage. The NPXY250-405 nanopositioner is a piezo driven, flexure guided stage, designed for economical XY positioning and scanning. Having a position noise of 3nm with strain gauge sensors, this system provides the […]

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