Orthogonality Correction for Piezo Flexure Stages

nPoint is now offering an easy way for correcting the orthogonality error of XY scanners for the most demanding scanning applications. This capability is primarily used by OEM customers in applications such as Atomic Force Microscopy (AFM). An external method for measuring the orthogonality error is necessary prior to applying such correction. The AFM application […]

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What is Phase Lag and How to Measure It

Understanding phase lag is important when scanning at high speeds with piezo flexure stages. This article describes the phase relationship between the command signal and the stage response. The response is monitored using the internal (in this case capacitive) sensor. The bandwidth of a system is the key element to phase lag. Using control parameters […]

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Tip Tilt Piezo Stage Mirror Mounting

A tip tilt piezo stage provides the opportunity to dynamically scan a mirror with extreme precision and control. Piezo mirrors are used for laser beam steering and image stabilization applications. There are a variety of options built into nPoint systems for mounting purposes. Below are only a few suggestions, as custom mounting platforms and stages […]

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Components of a Nanopositioning System

Nanopositioning systems provide the opportunity to enable many advanced applications. Their use has spread from AFMs to optics and multiple new technologies. While selecting a system can be complex at times, there are three main components that work together to provide motion on the nanoscale. Each component will briefly be discussed and can be studied […]

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Tip Tilt Piezo Stage with Enhanced Precision

The RXY3-410 tip/tilt piezo stage is the latest addition to nPoint’s nanopositioning lineup.  This new stage is designed for advanced research and OEM markets where speed, precision, and flexibility are a priority. The RXY3-410 nanopositioner is a piezo driven, flexure guided stage designed for high speed and sub-microradian precision. Having a position noise of 0.2 […]

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